Scanning nanoindenter NanoScan

"NanoScan"

"Super NanoScan"

The scanning nanoindenter NanoScan - unique device for surface properties investigations and measurements of hardness and elastic modulus of superhard materials and thin films (coatings). The system has been developed on the principles of Scanning Probe Microscopy (SPM) and represents a scanning force microscope (SFM) of original construction.

• easy to install and use
• high-resolution image of surface relief and elastic modulus map
• hardness measurements of superhard materials
• elastic modulus measurements of superhard materials and thin films
• capacitance and resistance imaging of semiconductors surface
• measurements are made in the open air with no special sample preparation

This device allows to perform the following simultaneous high-resolution measurements:

• Obtaining a surface relief picture as a result of surface scanning. Perfect for surface structure and relief investigation.
• Obtaining the mechanical properties distribution map of the surface simultaneously with the surface relief scanning. Measuring the elastic modulus with an extra spatial resolution. Ideal for investigation of both multiphase materials structure and redistribution of mechanical heterogeneities along the surface.
• Performing a micro- and nanoindentation and sclerometry tests of the material with the subsequent scanning of the indentation area. Excellent for materials hardness testing with a submicron scale and for investigation of their breakdown nature. Successfully applied for investigation of properties of thin films and superhard materials.
• Measuring the numerical value of elastic modulus with an extra spatial resolution for wide range of objects, including hard and superhard materials.

The measurements are made in the open air without any special sample preparation.

MODES

Surface topography Elastic modulus map	Elastic modulus (loading curves)
Hardness / sclerometry (scratch hardness testing)	Hardness / nanoindentation (load-displacement curves)

SPECIFICATION

		NanoScan	Super NanoScan
	Measurement modes:	Contact dynamic mode (topography / elasticity modulus map) Indentation / sclerometry (max. load of 20 g.) Loading / unloading curves (elastic modulus, VAC, CV)
			Dynamic nanoindentation (Oliver - Pharr);
	Range of measured values:	hardness:    1-100 GPa elastic modulus:   1-1000 GPa
	Scanning window:	XY - up to 10 mkm with step down to 0.2 nm; Z - up to 15 mkm with step down to 0.2 nm;	XY - up to 100 mkm with step down to 1 nm; Z - up to 15 mkm with step down to 0.2 nm;
	Optical visualization:	field 2x3 mm resolution 300x400 lines	Microscope 7x zoom, max field 2x2 mm; Color CCD camera 1392х1040
	Size of samples:	up to ø100 mm / 100 g weight	up to ø250 mm / 100 mm height / 3 kg weight
	Cantilever:	Ceramic piezo-cantilever
	Tips:	Diamond tips / Tips made of ultrahard fullerite C60
	Control computer:	P4 / 1024MB / 3.0 GHz / Video 256MB, OpenGL/ Operating system: Windows 2000/XP
	Vibration isolation:	Silicon stage/box	Silicon platform
		Suppression factor for industrial vibration noises ~ 10-7

AREAS OF APPLICATION

Thin films and coatings Nanophase and composite materials Superhard materials and alloys Diamonds and diamond powders Surfaces for micro-engineering and microelectronics

The NanoScan^TMmeasuring system took the first place on the International Invention Exhibition in Geneve in 1999 year and was awardedwith a diploma and a gold medal.

All the original technicaldecisions applied in NanoScan^TM measuring system are protected by the copyright laws of theRussian Federation.

up