Research and monitoring of surface
properties with nano-scale resolution

PUBLICATIONS

1. V.Blank, M.Popov, N.Lvova, K.Gogolinsky, V.Reshetov, Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip, J. Mater. Res., 12 (1997), 3109.
2. Gogolinsky K.V., Reshetov V.N., The use of scanning probe microscopes for analysis with submicron and nanometer resolution of the structure and distribution of mechanical properties of the materials (Review), Industrial Laboratory. Diagnostics of Materials, 1998, N.6, T.64, pp. 30-43.
3. V.Blank, M.Popov, G.Pivovarov, N.Lvova, K.Gogolinsky, V.Reshetov, Ultrahard and superhard phases of fullerite C60: Comparison with diamond on hardness and wear., Diamond and Related Materials 7 (2-5) (1998), pp. 427-431.
4. K. Gogolinsky, Application SPM NanoScan for investigation of structure and mechanical properties of diamond-like thin films, Proceedings All-Russian Seminar "Probe Microscopy-98" (1998), pp. 72-81 (Was published in Russian only.)
5. V.Blank, M.Popov, G. Pivovarov, N.Lvova, S.Terentev, Mechanical properties of different types of diamonds, Diamond and Related Materials 8 (1999), pp. 1531-1535.
6. V. Denisov, L. Kuzik, N.Lvova et al., Hard diamond-like layers produced during DIII-D tokamak operations, Physics Letters A 239 (1998), pp.328-331.
7. S. Grudzinskaya, Z. Ya. Kosakovskaya, V. N. Reshetov, A. A. Chaban, Elastic Properties of Dense Nanotube Layers, Acoustical Physics, Vol. 47, No. 5, 2001, pp. 548-551.
8. M. Muck, A. Soshnikov, R. Ries, M. Adler, A. Richter und H. Vollstaedt. "Diamantgebundene Schleifkorper und deren Optimierung mit dem Nanoscan" (in German). - Scientific Reports Journal of the University of Applied Sciences Mittweida, Proceedings IWKM 2003: Moderne Verfahren und Anwendungen in der Oberflachentechnik (ISSN I437-7624), Nr. 4 (2003) 49-53.
9. M. Muck, A. Soshnikov, B. Wolf, A. Richter. "Vom Indent zum Scratch - Nanomechanische Test" (in German). - Wissensch. Betr., ISSN 0949-8214, 2003, pp. 59-64.
10. Useinov A.S. A Nanoindentation Method for Measuring the Young Modulus of Superhard Materials Using a NanoScan Scanning Probe Microscope // Instruments and Experimental Techniques - Vol. 47, No. 1 - 2004 - pp. 119–123
11. Ye. Bilevych, A. Soshnikov, L. Darchuk, M. Apatskaya, Z. Tsybrii, M. Vuychik, A. Boka, F. Sizov, O. Boelling, B. Sulkio-Cleff. Influence of substrate materials on the properties of CdTe thin films grown by hot-wall epitaxy. Journal of Crystal Growth 275 (2005)
12. A.I. Soshnikov, K.V. Gogolinsky, V.D. Blank, V.N. Reshetov. The measurement of electrical properties of nanostructures with use of conductive diamond tip.// Basel, Switzerland / Accepted in "Journal of Physics: Conference Series" (2006)

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